Capacitance study of integrated circuits matrix interconnects

Propagation delays and couplings between nearby lines affect the circuit performances (speed, power consumption) and operations. Propagation delays in longer lines can become critical compared to the clock frequency and can induce unwanted signals in neighboring lines ("crosstalk" phenomen...

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Main Authors: Lakhlef, Ahcene (Author), Benfdila, Arezki (Author), Belhimer, Lounas (Author)
Format: EJournal Article
Published: Institute of Advanced Engineering and Science, 2021-05-01.
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100 1 0 |a Lakhlef, Ahcene  |e author 
100 1 0 |e contributor 
700 1 0 |a Benfdila, Arezki  |e author 
700 1 0 |a Belhimer, Lounas  |e author 
245 0 0 |a Capacitance study of integrated circuits matrix interconnects 
260 |b Institute of Advanced Engineering and Science,   |c 2021-05-01. 
500 |a https://ijeecs.iaescore.com/index.php/IJEECS/article/view/23607 
520 |a Propagation delays and couplings between nearby lines affect the circuit performances (speed, power consumption) and operations. Propagation delays in longer lines can become critical compared to the clock frequency and can induce unwanted signals in neighboring lines ("crosstalk" phenomenon). Induced line capacitances can induce parasitic signals. Hence characterizing of these capacitances is of paramount importance. The present work deals with the analysis of capacitance of a multilayer conductor interconnect aiming for their possible exact extraction. We used three topologies of a microstrip conductor interconnects and identified the potential distributor and then computed the capacitance and inductance matrix using a finite element method. The first analysis dealt with parallel microstrip conductors and the second with two levels (plan) of a microstrip conductors the results are compared to those obtained by other methods and found quite encouraging. 
540 |a Copyright (c) 2021 Institute of Advanced Engineering and Science 
540 |a http://creativecommons.org/licenses/by-nc/4.0 
546 |a eng 
690
690 |a Interconnects; Multiconductor; Capacitance; Inductance; Integrated Circuits 
655 7 |a info:eu-repo/semantics/article  |2 local 
655 7 |a info:eu-repo/semantics/publishedVersion  |2 local 
655 7 |2 local 
786 0 |n Indonesian Journal of Electrical Engineering and Computer Science; Vol 22, No 2: May 2021; 1156-1164 
786 0 |n 2502-4760 
786 0 |n 2502-4752 
786 0 |n 10.11591/ijeecs.v22.i2 
787 0 |n https://ijeecs.iaescore.com/index.php/IJEECS/article/view/23607/15012 
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