Data-driven Methods for Fault Localization in Process Technology

Control systems at production plants consist of a large number of process variables. When detecting abnormal behavior, these variables generate an alarm. Due to the interconnection of the plant's devices the fault can lead to an alarm flood. This again hides the original location of the causing...

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Main Author: Kühnert, Christian (auth)
Format: Book Chapter
Published: KIT Scientific Publishing 2013
Subjects:
Online Access:Get Fullteks
DOAB: description of the publication
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001 doab_20_500_12854_44557
005 20210211
020 |a KSP/1000036427 
020 |a 9783731500988 
024 7 |a 10.5445/KSP/1000036427  |c doi 
041 0 |a English 
042 |a dc 
100 1 |a Kühnert, Christian  |4 auth 
245 1 0 |a Data-driven Methods for Fault Localization in Process Technology 
260 |b KIT Scientific Publishing  |c 2013 
300 |a 1 electronic resource (XVIII, 194 p. p.) 
506 0 |a Open Access  |2 star  |f Unrestricted online access 
520 |a Control systems at production plants consist of a large number of process variables. When detecting abnormal behavior, these variables generate an alarm. Due to the interconnection of the plant's devices the fault can lead to an alarm flood. This again hides the original location of the causing device. In this work several data-driven approaches for root cause localization are proposed, compared and combined. All methods analyze disturbed process data for backtracking the propagation path. 
540 |a Creative Commons  |f https://creativecommons.org/licenses/by-sa/4.0/  |2 cc  |4 https://creativecommons.org/licenses/by-sa/4.0/ 
546 |a English 
653 |a Time series 
653 |a Signal processing 
653 |a Data Mining 
653 |a System identification 
653 |a Causality 
856 4 0 |a www.oapen.org  |u https://www.ksp.kit.edu/9783731500988  |7 0  |z Get Fullteks 
856 4 0 |a www.oapen.org  |u https://directory.doabooks.org/handle/20.500.12854/44557  |7 0  |z DOAB: description of the publication