Design and Applications of Coordinate Measuring Machines

Coordinate measuring machines (CMMs) have been conventionally used in industry for 3-dimensional and form-error measurements of macro parts for many years. Ever since the first CMM, developed by Ferranti Co. in the late 1950s, they have been regarded as versatile measuring equipment, yet many CMMs o...

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Main Author: Kuang-Chao Fan (Ed.) (auth)
Format: Book Chapter
Published: MDPI - Multidisciplinary Digital Publishing Institute 2016
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LEADER 02687naaaa2200325uu 4500
001 doab_20_500_12854_44810
005 20210211
020 |a books978-3-03842-277-8 
020 |a 9783038422778 
020 |a 9783038422761 
024 7 |a 10.3390/books978-3-03842-277-8  |c doi 
041 0 |a English 
042 |a dc 
100 1 |a Kuang-Chao Fan (Ed.)  |4 auth 
245 1 0 |a Design and Applications of Coordinate Measuring Machines 
260 |b MDPI - Multidisciplinary Digital Publishing Institute  |c 2016 
300 |a 1 electronic resource (XII, 198 p.) 
506 0 |a Open Access  |2 star  |f Unrestricted online access 
520 |a Coordinate measuring machines (CMMs) have been conventionally used in industry for 3-dimensional and form-error measurements of macro parts for many years. Ever since the first CMM, developed by Ferranti Co. in the late 1950s, they have been regarded as versatile measuring equipment, yet many CMMs on the market still have inherent systematic errors due to the violation of the Abbe Principle in its design. Current CMMs are only suitable for part tolerance above 10 μm. With the rapid advent of ultraprecision technology, multi-axis machining, and micro/nanotechnology over the past twenty years, new types of ultraprecision and micro/nao-CMMs are urgently needed in all aspects of society. This Special Issue accepted papers revealing novel designs and applications of CMMs, including structures, probes, miniaturization, measuring paths, accuracy enhancement, error compensation, etc. Detailed design principles in sciences, and technological applications in high-tech industries, were required for submission. Topics covered, but were not limited to, the following areas: 1. New types of CMMs, such as Abbe-free, multi-axis, cylindrical, parallel, etc. 2. New types of probes, such as touch-trigger, scanning, hybrid, non-contact, microscopic, etc. 3. New types of Micro/nano-CMMs. 4. New types of measuring path strategy, such as collision avoidance, free-form surface, aspheric surface, etc. 5. New types of error compensation strategy. 
540 |a Creative Commons  |f https://creativecommons.org/licenses/by-nc-nd/4.0/  |2 cc  |4 https://creativecommons.org/licenses/by-nc-nd/4.0/ 
546 |a English 
653 |a error compensation 
653 |a measuring path 
653 |a contact or noncontact probe 
653 |a micro/nano-CMM 
653 |a coordinate measuring machine 
653 |a structural design 
653 |a free-form measurement 
856 4 0 |a www.oapen.org  |u http://www.mdpi.com/books/pdfview/book/233  |7 0  |z Get Fullteks 
856 4 0 |a www.oapen.org  |u https://directory.doabooks.org/handle/20.500.12854/44810  |7 0  |z DOAB: description of the publication