Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodo...

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Bibliographic Details
Main Author: Niknahad, Mahtab (auth)
Format: Book Chapter
Published: KIT Scientific Publishing 2013
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Online Access:Get Fullteks
DOAB: description of the publication
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001 doab_20_500_12854_61792
005 20210212
020 |a KSP/1000035134 
020 |a 9783731500384 
024 7 |a 10.5445/KSP/1000035134  |c doi 
041 0 |a English 
042 |a dc 
100 1 |a Niknahad, Mahtab  |4 auth 
245 1 0 |a Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space 
260 |b KIT Scientific Publishing  |c 2013 
300 |a 1 electronic resource (IX, 146 p. p.) 
506 0 |a Open Access  |2 star  |f Unrestricted online access 
520 |a Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations. 
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546 |a English 
653 |a Space 
653 |a High reliability 
653 |a FPGA 
653 |a Redundancy 
653 |a Single Event Upset 
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856 4 0 |a www.oapen.org  |u https://directory.doabooks.org/handle/20.500.12854/61792  |7 0  |z DOAB: description of the publication