Zur Lösemitteldiffusion in Polymernanoschichten: Schichtdicken- und Konzentrationsabhängigkeit

Solution-casted polymer nanolayers are part of many technical applications. The solvent mass transport parameters are often unknown. However, they are a decisive factor for the determination of drying times, amounts of trace solvent, long-term stability and multilayer intermixing. By setting up a me...

Full description

Saved in:
Bibliographic Details
Main Author: Buss, Felix (auth)
Format: Book Chapter
Published: KIT Scientific Publishing 2017
Subjects:
Online Access:Get Fullteks
DOAB: description of the publication
Tags: Add Tag
No Tags, Be the first to tag this record!
LEADER 01657naaaa2200325uu 4500
001 doab_20_500_12854_62966
005 20210212
020 |a KSP/1000060263 
020 |a 9783731505914 
024 7 |a 10.5445/KSP/1000060263  |c doi 
041 0 |a German 
042 |a dc 
100 1 |a Buss, Felix  |4 auth 
245 1 0 |a Zur Lösemitteldiffusion in Polymernanoschichten: Schichtdicken- und Konzentrationsabhängigkeit 
260 |b KIT Scientific Publishing  |c 2017 
300 |a 1 electronic resource (XVIII, 186 p. p.) 
506 0 |a Open Access  |2 star  |f Unrestricted online access 
520 |a Solution-casted polymer nanolayers are part of many technical applications. The solvent mass transport parameters are often unknown. However, they are a decisive factor for the determination of drying times, amounts of trace solvent, long-term stability and multilayer intermixing. By setting up a measurement system and conducting experimental and numerical investigations the difference in mass transport characteristics in micro- to nanoscale polymer layers is shown. 
540 |a Creative Commons  |f https://creativecommons.org/licenses/by-sa/4.0/  |2 cc  |4 https://creativecommons.org/licenses/by-sa/4.0/ 
546 |a German 
653 |a Nanoschichten 
653 |a Sorption 
653 |a Quartz-Crystal-Microbalance 
653 |a nanolayers 
653 |a Trocknung 
653 |a Diffusion 
653 |a sorption 
653 |a Quarz-Kristall-MikrowaageDrying 
856 4 0 |a www.oapen.org  |u https://www.ksp.kit.edu/9783731505914  |7 0  |z Get Fullteks 
856 4 0 |a www.oapen.org  |u https://directory.doabooks.org/handle/20.500.12854/62966  |7 0  |z DOAB: description of the publication