Advanced Process Monitoring for Industry 4.0
This book reports recent advances on Process Monitoring (PM) to cope with the many challenges raised by the new production systems, sensors and "extreme data" conditions that emerged with Industry 4.0. Concepts such as digital-twins and deep learning are brought to the PM arena, pushing fo...
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| Format: | Book Chapter |
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Basel, Switzerland
MDPI - Multidisciplinary Digital Publishing Institute
2021
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| Online Access: | Get Fullteks DOAB: description of the publication |
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| LEADER | 04021naaaa2201045uu 4500 | ||
|---|---|---|---|
| 001 | doab_20_500_12854_76899 | ||
| 005 | 20220111 | ||
| 020 | |a books978-3-0365-2074-2 | ||
| 020 | |a 9783036520735 | ||
| 020 | |a 9783036520742 | ||
| 024 | 7 | |a 10.3390/books978-3-0365-2074-2 |c doi | |
| 041 | 0 | |a English | |
| 042 | |a dc | ||
| 072 | 7 | |a TB |2 bicssc | |
| 100 | 1 | |a Reis, Marco S. |4 edt | |
| 700 | 1 | |a Gao, Furong |4 edt | |
| 700 | 1 | |a Reis, Marco S. |4 oth | |
| 700 | 1 | |a Gao, Furong |4 oth | |
| 245 | 1 | 0 | |a Advanced Process Monitoring for Industry 4.0 |
| 260 | |a Basel, Switzerland |b MDPI - Multidisciplinary Digital Publishing Institute |c 2021 | ||
| 300 | |a 1 electronic resource (288 p.) | ||
| 506 | 0 | |a Open Access |2 star |f Unrestricted online access | |
| 520 | |a This book reports recent advances on Process Monitoring (PM) to cope with the many challenges raised by the new production systems, sensors and "extreme data" conditions that emerged with Industry 4.0. Concepts such as digital-twins and deep learning are brought to the PM arena, pushing forward the capabilities of existing methodologies to handle more complex scenarios. The evolution of classical paradigms such as Latent Variable modeling, Six Sigma and FMEA are also covered. Applications span a wide range of domains such as microelectronics, semiconductors, chemicals, materials, agriculture, as well as the monitoring of rotating equipment, combustion systems and membrane separation processes. | ||
| 540 | |a Creative Commons |f https://creativecommons.org/licenses/by/4.0/ |2 cc |4 https://creativecommons.org/licenses/by/4.0/ | ||
| 546 | |a English | ||
| 650 | 7 | |a Technology: general issues |2 bicssc | |
| 653 | |a spatial-temporal data | ||
| 653 | |a pasting process | ||
| 653 | |a process image | ||
| 653 | |a convolutional neural network | ||
| 653 | |a Industry 4.0 | ||
| 653 | |a auto machine learning | ||
| 653 | |a failure mode effects analysis | ||
| 653 | |a risk priority number | ||
| 653 | |a rolling bearing | ||
| 653 | |a condition monitoring | ||
| 653 | |a classification | ||
| 653 | |a OPTICS | ||
| 653 | |a statistical process control | ||
| 653 | |a control chart pattern | ||
| 653 | |a disruptions | ||
| 653 | |a disruption management | ||
| 653 | |a fault diagnosis | ||
| 653 | |a construction industry | ||
| 653 | |a plaster production | ||
| 653 | |a neural networks | ||
| 653 | |a decision support systems | ||
| 653 | |a expert systems | ||
| 653 | |a failure mode and effects analysis (FMEA) | ||
| 653 | |a discriminant analysis | ||
| 653 | |a non-intrusive load monitoring | ||
| 653 | |a load identification | ||
| 653 | |a membrane | ||
| 653 | |a data reconciliation | ||
| 653 | |a real-time | ||
| 653 | |a online | ||
| 653 | |a monitoring | ||
| 653 | |a Six Sigma | ||
| 653 | |a multivariate data analysis | ||
| 653 | |a latent variables models | ||
| 653 | |a PCA | ||
| 653 | |a PLS | ||
| 653 | |a high-dimensional data | ||
| 653 | |a statistical process monitoring | ||
| 653 | |a artificial generation of variability | ||
| 653 | |a data augmentation | ||
| 653 | |a quality prediction | ||
| 653 | |a continuous casting | ||
| 653 | |a multiscale | ||
| 653 | |a time series classification | ||
| 653 | |a imbalanced data | ||
| 653 | |a combustion | ||
| 653 | |a optical sensors | ||
| 653 | |a spectroscopy measurements | ||
| 653 | |a signal detection | ||
| 653 | |a digital processing | ||
| 653 | |a principal component analysis | ||
| 653 | |a curve resolution | ||
| 653 | |a data mining | ||
| 653 | |a semiconductor manufacturing | ||
| 653 | |a quality control | ||
| 653 | |a yield improvement | ||
| 653 | |a fault detection | ||
| 653 | |a process control | ||
| 653 | |a multi-phase residual recursive model | ||
| 653 | |a multi-mode model | ||
| 653 | |a process monitoring | ||
| 653 | |a n/a | ||
| 856 | 4 | 0 | |a www.oapen.org |u https://mdpi.com/books/pdfview/book/4369 |7 0 |z Get Fullteks |
| 856 | 4 | 0 | |a www.oapen.org |u https://directory.doabooks.org/handle/20.500.12854/76899 |7 0 |z DOAB: description of the publication |