Advances in Sensors and Sensing for Technical Condition Assessment and NDT

The adequate assessment of key apparatus conditions is a hot topic in all branches of industry. Various online and offline diagnostic methods are widely applied to provide early detections of any abnormality in exploitation. Furthermore, different sensors may also be applied to capture selected phys...

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Rannpháirtithe: Boczar, Tomasz (Eagarthóir), Kunicki, Michał (Eagarthóir), Wotzka, Daria (Eagarthóir), Nagi, Łukasz (Eagarthóir), Kozioł, Michał (Eagarthóir)
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Foilsithe / Cruthaithe: Basel, Switzerland MDPI - Multidisciplinary Digital Publishing Institute 2021
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041 0 |a English 
042 |a dc 
072 7 |a TB  |2 bicssc 
100 1 |a Boczar, Tomasz  |4 edt 
700 1 |a Kunicki, Michał  |4 edt 
700 1 |a Wotzka, Daria  |4 edt 
700 1 |a Nagi, Łukasz  |4 edt 
700 1 |a Kozioł, Michał  |4 edt 
700 1 |a Boczar, Tomasz  |4 oth 
700 1 |a Kunicki, Michał  |4 oth 
700 1 |a Wotzka, Daria  |4 oth 
700 1 |a Nagi, Łukasz  |4 oth 
700 1 |a Kozioł, Michał  |4 oth 
245 1 0 |a Advances in Sensors and Sensing for Technical Condition Assessment and NDT 
260 |a Basel, Switzerland  |b MDPI - Multidisciplinary Digital Publishing Institute  |c 2021 
300 |a 1 electronic resource (216 p.) 
506 0 |a Open Access  |2 star  |f Unrestricted online access 
520 |a The adequate assessment of key apparatus conditions is a hot topic in all branches of industry. Various online and offline diagnostic methods are widely applied to provide early detections of any abnormality in exploitation. Furthermore, different sensors may also be applied to capture selected physical quantities that may be used to indicate the type of potential fault. The essential steps of the signal analysis regarding the technical condition assessment process may be listed as: signal measurement (using relevant sensors), processing, modelling, and classification. In the Special Issue entitled "Advances in Sensors and Sensing for Technical Condition Assessment and NDT", we present the latest research in various areas of technology. 
540 |a Creative Commons  |f https://creativecommons.org/licenses/by/4.0/  |2 cc  |4 https://creativecommons.org/licenses/by/4.0/ 
546 |a English 
650 7 |a Technology: general issues  |2 bicssc 
653 |a pulse compression 
653 |a scattering 
653 |a attenuation 
653 |a insulation 
653 |a ultrasonic testing 
653 |a OLTC 
653 |a AE sensor 
653 |a acoustic emission 
653 |a feature extraction 
653 |a supervised classification 
653 |a machine learning 
653 |a contrast-enhanced ultrasound 
653 |a muscle perfusion 
653 |a Nakagami parameter 
653 |a compounding Nakagami imaging 
653 |a low-frequency sensor 
653 |a power transformer 
653 |a low-frequency noise 
653 |a genetic algorithm 
653 |a geometric layout of railway track 
653 |a track axis identification 
653 |a tramway loop 
653 |a route's polygon 
653 |a GNSS mobile measurements 
653 |a vibroarthography 
653 |a VAG 
653 |a knee joint 
653 |a spectral features 
653 |a frequency analysis 
653 |a non-invasive examination 
653 |a lateral temperature gradient 
653 |a temperature field 
653 |a boundary conditions 
653 |a solar radiation intensity 
653 |a temperature monitoring 
653 |a non-destructive evaluation 
653 |a eddy current 
653 |a 3D sensing 
653 |a inverse problem 
653 |a wavelet transform 
653 |a principal component analysis 
653 |a neural network 
653 |a incubation 
653 |a spectrum 
653 |a image processing 
653 |a ROC curve 
653 |a infrasound measurement system 
653 |a wind turbine 
653 |a infrasound correlation analysis 
653 |a measuring scale 
653 |a thermoelastic deformation 
653 |a coefficient of thermal expansion 
653 |a elastic waves 
653 |a laser ultrasound 
653 |a Fizeau fiber interferometer 
653 |a defect identification 
653 |a high-current pulses 
653 |a current measurement 
653 |a high-current shunts 
653 |a circuit modeling 
653 |a Rogowski coil 
653 |a electrodynamic accelerators 
653 |a n/a 
856 4 0 |a www.oapen.org  |u https://mdpi.com/books/pdfview/book/4778  |7 0  |z Get Fullteks 
856 4 0 |a www.oapen.org  |u https://directory.doabooks.org/handle/20.500.12854/77160  |7 0  |z DOAB: description of the publication