Solid-Liquid Two-Phase Flow Image Reconstruction Based on ERT Technique in Microchannel

Monitoring the flow behaviour on the micro-scale is very important in many industrial and biochemical process, the multiphase coexistence in microchannel provides many attractive characteristics compared to a single-phase flow. The precise flow rate control and well-defined channel geometries make i...

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Main Authors: Liu, Yonghong (Author), Wang, Xiantao (Author), Takei, Masahiro (Author)
Format: EJournal Article
Published: Institute of Advanced Engineering and Science, 2013-01-10.
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LEADER 01925 am a22002893u 4500
001 ijeecs1950_792
042 |a dc 
100 1 0 |a Liu, Yonghong  |e author 
100 1 0 |e contributor 
700 1 0 |a Wang, Xiantao  |e author 
700 1 0 |a Takei, Masahiro  |e author 
245 0 0 |a Solid-Liquid Two-Phase Flow Image Reconstruction Based on ERT Technique in Microchannel 
260 |b Institute of Advanced Engineering and Science,   |c 2013-01-10. 
520 |a Monitoring the flow behaviour on the micro-scale is very important in many industrial and biochemical process, the multiphase coexistence in microchannel provides many attractive characteristics compared to a single-phase flow. The precise flow rate control and well-defined channel geometries make it possible for us to make detailed investigation on multiphase flow phenomena on micro scale. This paper aims at the solid-liquid two phase flow visualization in the cross-sections of a novel microchannel based on the electrical resistance tomography (ERT) technique. Experimental results reveal that ERT image reconstruction technique base on Agilent data acquisition system can effectively detect the particle distribution in the microchannel. DOI: http://dx.doi.org/10.11591/telkomnika.v11i1.1885 
540 |a Copyright (c) 2013 Institute of Advanced Engineering and Science 
540 |a http://creativecommons.org/licenses/by-nc-nd/4.0 
546 |a eng 
690
655 7 |a info:eu-repo/semantics/article  |2 local 
655 7 |a info:eu-repo/semantics/publishedVersion  |2 local 
655 7 |2 local 
786 0 |n Indonesian Journal of Electrical Engineering and Computer Science; Vol 11, No 1: January 2013; 173-180 
786 0 |n 2502-4760 
786 0 |n 2502-4752 
786 0 |n 10.11591/ijeecs.v11.i1 
787 0 |n https://ijeecs.iaescore.com/index.php/IJEECS/article/view/1950/792 
856 4 1 |u https://ijeecs.iaescore.com/index.php/IJEECS/article/view/1950/792  |z Get fulltext