SVR-based RPD approach for complex processes and its application in circuit optimization
During the lifespan of electronic products, the output voltage and current fluctuate due to the random fluctuations of parameter values of circuit components and environmental noise. Extant methods of circuit designs, such as parameter sweep and sensitivity analysis, are hard to obtain global robust...
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| Main Authors: | , , , |
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| Format: | EJournal Article |
| Published: |
Institute of Advanced Engineering and Science,
2013-03-01.
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| Subjects: | |
| Online Access: | Get fulltext |
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