Work function variations on electrostatic and RF performances of JLSDGM Device

This paper offers a systematic analysis on the impact of work function (WF) variations on electrostatic and radio frequency (RF) performances of nchannel junctionless strained double gate (DG) (n-JLSDGM) metal oxide semiconductor field effect transistor (MOSFET). The study has been performed under o...

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Main Authors: E. Kaharudin, K K. (Author), Salehuddin, F. (Author), M. Zain, A. S. (Author), Roslan, Ameer F. (Author), Ahmad, I (Author)
格式: EJournal Article
出版: Institute of Advanced Engineering and Science, 2021-07-01.
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索引号: A1234.567
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