Material Characterization and Failure Analysis for Microelectronics Assembly Processes
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Main Authors: | Chien-Yi Huang (Author), Ming-Shu Li (Author), Shan-Yu Huang (Author), Cheng-I Chang (Author), Min-Hui Huang (Author) |
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Format: | Ebooks |
Published: |
IntechOpen,
2011-11-09.
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Online Access: | Get Online |
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