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  1. 1
    A Comprehensive Review on Applications of Don't Care Bit Filling Techniques for Test Power Reduction in Digital VLSI Systems
    por Mitra, Sanjoy, Das, Debaprasad
    Publicado 2018
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    EJournal Article
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  2. 2
    A SoC-IP Core Test Data Compression Scheme based on Error Correcting Hamming Codes
    por Mitra, Sanjoy, Das, Debaprasad
    Publicado 2018
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    EJournal Article
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