Magnetic sensitivity modeling of dual gate MOS transistor

In this paper, the magnetic field effect on the carrier transport phenomenon in the double gate metal-oxide-semiconductor field-effect transistor (MOSFET) has been investigated. This is done by exploring the Lorentz force and the behavior of a semiconductor subjected to a constant magnetic field. Th...

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Bibliographic Details
Main Authors: Kessi, Mohamed (Author), Benfdila, Arezki (Author)
Format: EJournal Article
Published: Institute of Advanced Engineering and Science, 2021-11-01.
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